01
Coatings
Galvanization, PVD, CVD, anodization, painting and treatments.
HORIBA Solutions / HORIBA GD-Profiler 2 GD-OES
GD-OES
HORIBA GD-Profiler 2 GD-OES
Quick elemental analysis of solids, surfaces, films, coatings and depth profiles by pulsed luminescent discharge RF.
110–800 nmspectral coverage
nm a 100+ µmdepth scale
Pulsed RFdischarge source
Summary
GD-Profiler 2 combines controlled sputtering and optical emission to measure surface composition to volume, including lightweight and multilayer elements.
Solution overview
Composition and depth in the same analysis
The discharge removes successive layers of the material. The spectrometer monitors the elemental intensity over time and the DIP interferometer helps the conversion in depth and erosion rate.
Applications
Primary applications
02
Batteries and power
Electrodes, interfaces, photovoltaics and functional materials.
03
Metallurgy
Decarbonation, nitriding, cementation, oxidation and alloy control.
Key features
Resources and settings
01
Light elements
Detection of H, O, C, N and Cl under appropriate conditions.
02
HDD
High dynamic range detectors for surface signal and volume.
03
QUANTUM
Software for acquisition, quantification and depth profile.
Reference data
Technical view
This summary supports preliminary evaluation; the final configuration must account for the sample matrix, method, analytical range and throughput.
TechniquePulsed-RF GD-OES
Coverage110 a 800 nm
AnalysisVolume, surface and depth profile
ProfundidadeNanometers at hundreds of micrometers, according to sample
Depth measurementDifferential Interferometer DIP
Frequently Asked Questions
Technical information
GD-OES measures layer thickness?
Yes. The profile can relate composition and depth, provided the method and erosion rate are properly established.
Is it necessary to dissolve the sample?
No. The analysis is direct on the solid surface compatible with the discharge chamber.
Is the method destructive?
It is microdestructive: the discharge forms a crater in the area analyzed.
Related pages
Related solutions
Application assessment
Inform the matrix, analytes or molecules of interest, expected range and volume of samples. SENS specifies the applicable configuration.